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ERIC Number: EJ896149
Record Type: Journal
Publication Date: 2010-Jul
Pages: 13
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-0033-3085
EISSN: N/A
Available Date: N/A
Adolescents' Satisfaction with School Experiences: Relationships with Demographics, Attachment Relationships, and School Engagement Behavior
Elmore, Gail M.; Huebner, E. Scott
Psychology in the Schools, v47 n6 p525-537 Jul 2010
This study investigated the relationships among demographics, parent and peer attachment, school satisfaction, and student engagement behavior in a 1-year longitudinal study of secondary-school students. Statistically significant cross-sectional differences in school satisfaction were observed, based on grade, but not on race, gender, or socioeconomic status. Level of school satisfaction did not moderate the relationships between parent and peer satisfaction and negative student engagement behaviors at Time 2 (controlling for Time 1). School satisfaction did account for significant incremental variance across all levels of parent and peer attachment relationships, although predicting a larger proportion of variance for withdrawal behavior than for resistance/aggression behavior. Adolescents' appraisals of their school satisfaction appear to be an independent predictor of their school engagement behaviors, regardless of the quality of their parent or peer attachment relationships. Limitations of the study as well as implications for future research and educational practice are discussed. (Contains 4 tables.)
John Wiley & Sons, Inc. Subscription Department, 111 River Street, Hoboken, NJ 07030-5774. Tel: 800-825-7550; Tel: 201-748-6645; Fax: 201-748-6021; e-mail: subinfo@wiley.com; Web site: http://www3.interscience.wiley.com.bibliotheek.ehb.be/browse/?type=JOURNAL
Publication Type: Journal Articles; Reports - Research
Education Level: Middle Schools
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Identifiers - Assessments and Surveys: Inventory of Parent and Peer Attachment
Grant or Contract Numbers: N/A
Author Affiliations: N/A