ERIC Number: EJ808344
Record Type: Journal
Publication Date: 2008
Pages: 15
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-0022-0655
EISSN: N/A
Available Date: N/A
Simulated Tests of Differential Item Functioning Using SIBTEST with and without Impact
Klockars, Alan J.; Lee, Yoonsun
Journal of Educational Measurement, v45 n3 p271-285 Fall 2008
Monte Carlo simulations with 20,000 replications are reported to estimate the probability of rejecting the null hypothesis regarding DIF using SIBTEST when there is DIF present and/or when impact is present due to differences on the primary dimension to be measured. Sample sizes are varied from 250 to 2000 and test lengths from 10 to 40 items. Results generally support previous findings for Type I error rates and power. Impact is inversely related to test length. The combination of DIF and impact, with the focal group having lower ability on both the primary and secondary dimensions, results in impact partially masking DIF so that items biased toward the reference group are less likely to be detected.
Descriptors: Test Bias, Test Length, Reference Groups, Probability, Monte Carlo Methods, Sample Size, Test Items
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Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
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Author Affiliations: N/A