ERIC Number: EJ794812
Record Type: Journal
Publication Date: 2005
Pages: 14
Abstractor: Author
ISBN: N/A
ISSN: ISSN-1059-308X
EISSN: N/A
Available Date: N/A
The Test-Retest Reliability of the Parent and School Survey (PASS)
Ringenberg, Matthew C.; Funk, Vanessa; Mullen, Kacy; Wilford, Amy; Kramer, Jessica
School Community Journal, v15 n2 p121-134 Fall-Win 2005
The Parent And School Survey (PASS) is an instrument designed to quickly, easily, and accurately measure parental involvement in their children's education. It is based on Epstein's six-construct framework, with four items devoted to each construct. A test-retest reliability study of the PASS was conducted with 40 subjects to refine the 24 items designed to measure parental involvement. The range and standard deviation of each item were also examined to determine breadth of responses in the sample. Finally, open-ended questions in which subjects interpreted the items were used to assess clarity. Consequently, 11 of the items were altered in order to compensate for identified limitations. The most common limitations included items that were too vaguely worded or didn't sufficiently encourage a wide range of responses. The rationale for each item change is discussed; further testing will be needed to support or refute these changes. Finally, future norming plans and intended uses of the PASS are considered. (Contains 4 tables.)
Descriptors: Parent Participation, Reliability, School Surveys, Parent School Relationship, Item Analysis
Academic Development Institute. 121 N. Kickapoo Street, Lincoln, IL 62656. Tel: 217-732-6462; Fax: 217-732-3696; Web site: http://www.adi.org/journal
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A
Author Affiliations: N/A