
ERIC Number: EJ701932
Record Type: Journal
Publication Date: 2004-Mar-1
Pages: 4
Abstractor: ERIC
ISBN: N/A
ISSN: ISSN-0746-3537
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Available Date: N/A
Using STL and AETL: Announcing Addenda to the Standards
Meade, Shelli; Delany, Lisa; Dugger, William E., Jr.
Technology Teacher, v63 n6 p24 Mar 2004
In March 2004, the International Technology Education Association (ITEA) will introduce a series of addenda to the technological literacy standards documents that will provide concrete tools for making technology programs standards based. Standards for Technological Literacy (STL) provides the content for technological studies. Advancing Excellence in Technological Literacy (AETL) provides companion standards for student assessment, professional development, and program enhancement. While AETL was intended to help the content standards become implemented, neither it nor STL contain specific strategies. The new addenda will detail the planning process involved as well as actions that educators can take to achieve technological literacy in the laboratory-classroom. When considering standards-based reform, it is necessary to look at all aspects of the technology program. AETL defines program as everything that affects student learning. This includes content, professional development, curricula, instruction, student assessment, and the learning environment, implemented across grade levels. Correspondingly, the addenda documents will be designed around these aspects of program. This article discusses common characteristics of the new addenda documents.
Descriptors: Technological Literacy, Program Effectiveness, Educational Change, Technology Education, Professional Development, Curriculum Design
Publications Department, International Technology Education Association, 1914 Association Drive, Suite 201, Reston, VA 20191-1539. Tel: 703-860-2100; Fax: 703-860-0353; Web site: http://www.iteaconnect.org.
Publication Type: Journal Articles; Reports - Descriptive
Education Level: N/A
Audience: N/A
Language: English
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Authoring Institution: N/A
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