ERIC Number: EJ689699
Record Type: Journal
Publication Date: 2004-Jan
Pages: 24
Abstractor: Author
ISBN: N/A
ISSN: ISSN-0146-6216
EISSN: N/A
Available Date: N/A
Type I Error Rates for Generalized Graded Unfolding Model Fit Indices
DeMars, Christine E.
Applied Psychological Measurement, v28 n1 p48-71 Jan 2004
Type I error rates were examined for several fit indices available in GGUM2000: extensions of Infit, Outfit, Andrich's X(2), and the log-likelihood ratio X(2). Infit and Outfit had Type I error rates much lower than nominal alpha. Andrich's X(2) had Type I error rates much higher than nominal alpha, particularly for shorter tests or larger sample sizes. The log-likelihood X(2) had Type I error rates near or below nominal alpha for small samples or longer tests but had inflated error rates with large samples and shorter tests. For conditions in which the log-likelihood ratio X(2) did not perform well, alternative fit indices or modifications to these procedures should be considered in future studies.
Descriptors: Likert Scales, Error of Measurement, Goodness of Fit, Psychological Studies, Evaluation Methods, Measurement Techniques, Statistical Analysis, Probability
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Publication Type: Journal Articles; Reports - Evaluative
Education Level: N/A
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Language: English
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