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ERIC Number: EJ667398
Record Type: Journal
Publication Date: 2003
Pages: N/A
Abstractor: N/A
ISBN: N/A
ISSN: ISSN-1045-1064
EISSN: N/A
Available Date: N/A
Effects of Take-Home Tests and Study Questions on Retention Learning in Technology Education.
Haynie, W. J., III
Journal of Technology Education, v14 n2 p6-18 Spr 2003
Undergraduates were divided into four groups: (1) no study questions, multiple-choice test (n=71); (2) no questions, take-home test (n=71); (3) questions, no test (n=70); and (4) no questions, no test (n=67). The take-home group scored worst of all on novel information. They seem to have focused only on the required answers. (Contains 25 references.) (SK)
Descriptors: Higher Education, Retention (Psychology), Study Guides, Study Habits, Technology Education, Test Format
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A
Author Affiliations: N/A