The Influence of Test Characteristics on the Detection of Aberrant Response Patterns.

Reise, Steven P.; Due, Allan M.

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Peer reviewed

ERIC Number: EJ443840

Record Type: Journal

Publication Date: 1991

Pages: N/A

Abstractor: N/A

ISBN: N/A

ISSN: ISSN-0146-6216

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The Influence of Test Characteristics on the Detection of Aberrant Response Patterns.

Reise, Steven P.; Due, Allan M.

Applied Psychological Measurement, v15 n3 p217-26 Sep 1991

Previous person-fit research is extended through explication of an unexplored model for generating aberrant response patterns. The proposed model is then implemented to investigate the influence of test properties on the aberrancy detection power of a person-fit statistic. Difficulties of aberrancy detection are discussed. (SLD)

Descriptors: Algorithms, Computer Simulation, Item Response Theory, Mathematical Models, Monte Carlo Methods, Power (Statistics), Psychometrics, Test Construction, Test Length

Publication Type: Journal Articles; Reports - Evaluative

Education Level: N/A

Audience: N/A

Language: English

Sponsor: N/A

Authoring Institution: N/A

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Author Affiliations: N/A