The One-, Two- and Modified Two-Parameter Latent Trait Models: An Empirical Study of Relative Fit.

Albanese, Mark A.; Forsyth, Robert A.

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Peer reviewed

ERIC Number: EJ302086

Record Type: Journal

Publication Date: 1984

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The One-, Two- and Modified Two-Parameter Latent Trait Models: An Empirical Study of Relative Fit.

Albanese, Mark A.; Forsyth, Robert A.

Educational and Psychological Measurement, v44 n2 p229-46 Sum 1984

The purpose of this study was to compare the relative robustness of the one-, two-, and modified two-parameter latent trait logistic models for the Iowa Tests of Educational Development. Results suggest that the modified two-parameter model may provide the best representation of the data. (Author/BW)

Descriptors: Achievement Tests, Comparative Analysis, Goodness of Fit, Item Analysis, Latent Trait Theory, Mathematical Models, Secondary Education, Standardized Tests, Test Items

Publication Type: Reports - Research; Journal Articles

Education Level: N/A

Audience: N/A

Language: English

Sponsor: N/A

Authoring Institution: N/A

Identifiers - Assessments and Surveys: Iowa Tests of Educational Development

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Author Affiliations: N/A