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ERIC Number: EJ275567
Record Type: Journal
Publication Date: 1982
Pages: N/A
Abstractor: N/A
ISBN: N/A
ISSN: N/A
EISSN: N/A
Available Date: N/A
A Latent Trait Method for Determining Intrajudge Inconsistency in the Angoff and Nedelsky Techniques of Standard Setting.
Van der Linden, Wim J.
Journal of Educational Measurement, v19 n4 p295-308 Win 1982
An ignored aspect of standard setting, namely the possibility that Angoff or Nedelsky judges specify inconsistent probabilities (e.g., low probabilities for easy items but large probabilities for hard items) is explored. A latent trait method is proposed to estimate such misspecifications, and an index of consistency is defined. (Author/PN)
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
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Authoring Institution: N/A
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Author Affiliations: N/A