Memory-for-Designs, Intelligence, and Achievement of Educable Mentally Retarded Children.

Ong, Jin; Jones, Lowell, Jr.

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Peer reviewed

ERIC Number: EJ273735

Record Type: Journal

Publication Date: 1982-Oct

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Memory-for-Designs, Intelligence, and Achievement of Educable Mentally Retarded Children.

Ong, Jin; Jones, Lowell, Jr.

Perceptual and Motor Skills, v55 n2 p379-82 Oct 1982

Rank-difference correlations between Memory-for-Designs test, Wechsler Intelligence Scale for Children (WISC), and Wide Range Achievement Test scores for two classes of educable mentally retarded children showed high negative correlations between Memory-for-Designs and WISC Full Scale IQs. Visual memory accounted for 84 percent of variance in intelligence. (Author/CM)

Descriptors: Academic Achievement, Achievement Tests, Correlation, Elementary Education, Intelligence Differences, Intelligence Tests, Measurement Objectives, Memory, Mild Mental Retardation, Special Education, Test Interpretation, Test Use, Visual Perception

Publication Type: Journal Articles; Reports - Research

Education Level: N/A

Audience: N/A

Language: English

Sponsor: N/A

Authoring Institution: N/A

Identifiers - Assessments and Surveys: Wechsler Intelligence Scale for Children; Wide Range Achievement Test

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Author Affiliations: N/A