A "Nonbiased Assessment" of Intelligence Testing.

Vandivier, Phillip L.; Vandivier, Stella Sue

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Peer reviewed

ERIC Number: EJ220650

Record Type: Journal

Publication Date: 1979-Nov

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A "Nonbiased Assessment" of Intelligence Testing.

Vandivier, Phillip L.; Vandivier, Stella Sue

Educational Forum, v44 n1 p97-108 Nov 1979

Discusses the most widely used individual intelligence tests: Wechsler Intelligence Scale for Children (WISC) and Stanford-Binet Intelligence Scale (Form L-M). Covers what the tests measure; psychometric or technical properties of the tests; and how test results are used. (JOW)

Descriptors: Academic Achievement, Academic Aptitude, Background, Disadvantaged Youth, Educationally Disadvantaged, Intelligence, Intelligence Differences, Intelligence Tests, Predictive Validity, Special Education, Test Bias, Test Reliability, Test Results

Publication Type: Journal Articles; Opinion Papers

Education Level: N/A

Audience: N/A

Language: English

Sponsor: N/A

Authoring Institution: N/A

Identifiers - Assessments and Surveys: Stanford Binet Intelligence Scale; Wechsler Intelligence Scale for Children

Grant or Contract Numbers: N/A

Author Affiliations: N/A