Binomial Test Models and Item Difficulty.

van der Linden, Wim J.

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Peer reviewed

ERIC Number: EJ218749

Record Type: Journal

Publication Date: 1979

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Binomial Test Models and Item Difficulty.

van der Linden, Wim J.

Applied Psychological Measurement, v3 n3 p401-11 Sum 1979

The restrictions on item difficulties that must be met when binomial models are applied to domain-referenced testing are examined. Both a deterministic and a stochastic conception of item responses are discussed with respect to difficulty and Guttman-type items. (Author/BH)

Descriptors: Difficulty Level, Item Sampling, Latent Trait Theory, Mathematical Models, Matrices, Probability, Sampling, Statistical Analysis, Test Interpretation, Test Items

Publication Type: Journal Articles; Reports - General

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Audience: N/A

Language: English

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