Edumetric Validity of the Quarterly Profile Examination.

Willoughby, T. Lee; Hutcheson, Sam J.

Notes FAQ Contact Us

Back to results

Peer reviewed

ERIC Number: EJ198875

Record Type: Journal

Publication Date: 1978

Pages: N/A

Abstractor: N/A

ISBN: N/A

ISSN: N/A

EISSN: N/A

Available Date: N/A

Edumetric Validity of the Quarterly Profile Examination.

Willoughby, T. Lee; Hutcheson, Sam J.

Educational and Psychological Measurement, v38 n4 p1057-61 Win 1978

The standard growth expectations for various levels and categories of the Quarterly Profile Examination were reported in this study as an approach to assessing edumetric validity. The results demonstrated the usefulness of computing standard growth expectations for tests used in the measurement of within-individual growth. (Author/JKS)

Descriptors: Achievement Gains, Criterion Referenced Tests, Growth Patterns, Higher Education, Individual Development, Medical Students, Psychological Testing, Technical Reports, Test Reliability, Test Validity

Publication Type: Journal Articles; Reports - Research

Education Level: N/A

Audience: N/A

Language: English

Sponsor: N/A

Authoring Institution: N/A

Grant or Contract Numbers: N/A

Author Affiliations: N/A