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ERIC Number: EJ1324365
Record Type: Journal
Publication Date: 2021-Oct
Pages: 16
Abstractor: As Provided
ISBN: N/A
ISSN: EISSN-1939-1382
EISSN: N/A
Available Date: N/A
Logistic Knowledge Tracing: A Constrained Framework for Learner Modeling
Pavlik, Philip; Eglington, Luke; Harrell-Williams, Leigh
IEEE Transactions on Learning Technologies, v14 n5 p624-639 Oct 2021
Adaptive learning technology solutions often use a learner model to trace learning and make pedagogical decisions. The present research introduces a formalized methodology for specifying learner models, logistic knowledge tracing (LKT), that consolidates many extant learner modeling methods. The strength of LKT is the specification of a symbolic notation system for alternative logistic regression models that is powerful enough to specify many extant models in the literature and many new models. To demonstrate the generality of LKT, we fit 12 models, some variants of well-known models and some newly devised, to six learning technology datasets. The results indicated that no single learner model was best in all cases, further justifying a broad approach that considers multiple learner model features and the learning context. We introduce features to stand in for student-level intercepts and argue that to be maximally applicable, a learner model needs to adapt to student differences. The results of our comparisons show the general importance of modeling recent learning for all datasets, with special importance for terms that model memory in datasets involving fact learning.
Institute of Electrical and Electronics Engineers, Inc. 445 Hoes Lane, Piscataway, NJ 08854. Tel: 732-981-0060; Web site: http://ieeexplore.ieee.org/xpl/RecentIssue.jsp?punumber=4620076
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: National Science Foundation (NSF); Institute of Education Sciences (ED)
Authoring Institution: N/A
IES Funded: Yes
Grant or Contract Numbers: 1443068; R305A190448
Author Affiliations: N/A