ERIC Number: ED603374
Record Type: Non-Journal
Publication Date: 2018
Pages: 17
Abstractor: As Provided
ISBN: N/A
ISSN: EISSN-
EISSN: N/A
Available Date: N/A
Assessing Item-Level Fit for Higher Order Item Response Theory Models
Zhang, Xue; Wang, Chun; Tao, Jian
Grantee Submission, Applied Psychological Measurement v42 n8 p644-659 2018
Testing item-level fit is important in scale development to guide item revision/deletion. Many item-level fit indices have been proposed in literature, yet none of them were directly applicable to an important family of models, namely, the higher order item response theory (HO-IRT) models. In this study, chi-square-based fit indices (i.e., Yen's Q[subscript 1], McKinley and Mill's G[superscript 2], Orlando and Thissen's S-X[superscript 2], and S-G[superscript 2]) were extended to HO-IRT models. Their performances are evaluated via simulation studies in terms of false positive rates and correct detection rates. The manipulated factors include test structure (i.e., test length and number of dimensions), sample size, level of correlations among dimensions, and the proportion of misfitting items. For misfitting items, the sources of misfit, including the misfitting item response functions, and misspecifying factor structures were also manipulated. The results from simulation studies demonstrate that the S-G[superscript 2] is promising for higher order items.
Descriptors: Item Response Theory, Models, Test Items, Goodness of Fit, Error of Measurement, Bayesian Statistics
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: Institute of Education Sciences (ED)
Authoring Institution: N/A
IES Funded: Yes
Grant or Contract Numbers: R305D170042
Author Affiliations: N/A