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Félix González-Carrasco; Felipe Espinosa Parra; Izaskun Álvarez-Aguado; Sebastián Ponce Olguín; Vanessa Vega Córdova; Miguel Roselló-Peñaloza – British Journal of Learning Disabilities, 2025
Background: The study focuses on the need to optimise assessment scales for support needs in individuals with intellectual and developmental disabilities. Current scales are often lengthy and redundant, leading to exhaustion and response burden. The goal is to use machine learning techniques, specifically item-reduction methods and selection…
Descriptors: Artificial Intelligence, Intellectual Disability, Developmental Disabilities, Individual Needs
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Jun-ichiro Yasuda; Michael M. Hull; Naohiro Mae; Kentaro Kojima – Physical Review Physics Education Research, 2025
Although conceptual assessment tests are commonly administered at the beginning and end of a semester, this pre-post approach has inherent limitations. Specifically, education researchers and instructors have limited ability to observe the progression of students' conceptual understanding throughout the course. Furthermore, instructors are limited…
Descriptors: Computer Assisted Testing, Adaptive Testing, Science Tests, Scientific Concepts
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Hambleton, Ronald K. – Educational and Psychological Measurement, 1987
This paper presents an algorithm for determining the number of items to measure each objective in a criterion-referenced test when testing time is fixed and when the objectives vary in their levels of importance, reliability, and validity. Results of four special applications of the algorithm are presented. (BS)
Descriptors: Algorithms, Behavioral Objectives, Criterion Referenced Tests, Test Construction
Hambleton, Ronald K. – 1986
The problem of determining optimal test lengths with fixed total testing time has proved to be a difficult one for criterion-referenced test developers. An algorithm is needed which can be used by test developers to allocate available testing time to maximize the validity of their total criterion-referenced tests or testing programs. To be…
Descriptors: Algorithms, Criterion Referenced Tests, Elementary Secondary Education, Psychometrics