Descriptor
| Intelligence Tests | 3 |
| Test Bias | 3 |
| Test Reliability | 3 |
| Test Validity | 3 |
| Tests | 2 |
| Academic Achievement | 1 |
| Diagnostic Tests | 1 |
| Elementary Secondary Education | 1 |
| Intelligence | 1 |
| Intelligence Quotient | 1 |
| Mental Retardation | 1 |
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Source
| Educational Forum | 3 |
Publication Type
| Journal Articles | 3 |
| Opinion Papers | 2 |
| Reports - Research | 1 |
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Assessments and Surveys
| Stanford Binet Intelligence… | 1 |
| Wechsler Intelligence Scale… | 1 |
What Works Clearinghouse Rating
Peer reviewedLippmann, Walter – Educational Forum, 1986
The author answers Terman's allegations. He states that, while he honestly thinks that there is a considerable future for mental testing, it is also a field that could be dangerous if the people in positions of leadership are "loose-minded." (CT)
Descriptors: Intelligence Tests, Test Bias, Test Reliability, Test Validity
Peer reviewedTerman, Lewis M. – Educational Forum, 1986
Examines a few samples of Walter Lippmann's allegations concerning the validity of intelligence tests. (CT)
Descriptors: Intelligence Quotient, Intelligence Tests, Test Bias, Test Reliability
Peer reviewedVandivier, Phillip L.; Vandivier, Stella Sue – Educational Forum, 1979
Arguments and prejudices against the use of individually administered intelligence tests are considered and compared with possible values that may be obtained. Cautions about test score interpretation are discussed. Implications of abolishing intelligence testing are considered and recommendations for effective testing policies are presented. (CTM)
Descriptors: Academic Achievement, Diagnostic Tests, Elementary Secondary Education, Intelligence
