Descriptor
| Intelligence Tests | 6 |
| Test Selection | 6 |
| Test Use | 6 |
| Test Reliability | 3 |
| Test Validity | 3 |
| Evaluation Methods | 2 |
| Screening Tests | 2 |
| Student Evaluation | 2 |
| Test Reviews | 2 |
| Ability | 1 |
| Academically Gifted | 1 |
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Author
| Bell, Nancy L. | 1 |
| Blakemore, Thomas | 1 |
| Campbell, Susan | 1 |
| Cannon, Barbara | 1 |
| DiPietro, Ellette | 1 |
| Ellis, James T. | 1 |
| Fields, Joyce I. | 1 |
| Lifter, Karin | 1 |
| Luiselli, James K. | 1 |
| McCaffery, Lucy K. | 1 |
| Nagle, Richard J. | 1 |
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| Reports - Research | 5 |
| Journal Articles | 4 |
| Guides - Non-Classroom | 1 |
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| Reference Materials -… | 1 |
| Speeches/Meeting Papers | 1 |
Education Level
Audience
| Practitioners | 1 |
Location
| Malaysia | 1 |
Laws, Policies, & Programs
Assessments and Surveys
| Kaufman Brief Intelligence… | 1 |
| Stanford Binet Intelligence… | 1 |
| Wechsler Intelligence Scale… | 1 |
What Works Clearinghouse Rating
Peer reviewedNagle, Richard J.; Bell, Nancy L. – Psychology in the Schools, 1993
Investigated relationship between Stanford-Binet Intelligence Scale: Fourth Edition (SB:IV) abbreviated batteries and complete battery among 38 college students. Findings suggest that school psychologists who use abbreviated versions of SB:IV with older adolescents and young adults should be aware that these short forms may underestimate students'…
Descriptors: Ability, College Students, Higher Education, Intelligence Tests
Zimmerman, Irla L.; Woo-Sam, James M. – 1982
Two kinds of WISC-R short forms, item reduction and subtest reduction, are reviewed in terms of their ability to meet these criteria of adequacy: a significant correlation between the full scale IQ and the short form IQ, a non-significant difference between the full and short form mean IQ, a low percentage of IQ classification changes resulting…
Descriptors: Intelligence Tests, Test Interpretation, Test Items, Test Reliability
Peer reviewedPrewett, Peter N.; McCaffery, Lucy K. – Psychology in the Schools, 1993
Examined relationship between Kaufman Brief Intelligence Test (K-BIT), Stanford-Binet, two-subtests short form, and Kaufman Test of Educational Achievement (K-TEA) with population of 75 academically referred students. K-BIT correlated significantly with Stanford-Binet and K-TEA Math, Reading, and Spelling scores. Results support use of K-BIT as…
Descriptors: Elementary School Students, Elementary Secondary Education, Intelligence Tests, Screening Tests
Peer reviewedFields, Joyce I. – Early Child Development and Care, 1997
Evaluated five intelligence test instruments for use with Malaysian children: Raven's Sijil Pelajaran Malaysia (SPM), WISC-R, School Failure Tolerance (SFT), Scale for Rating Behavior Characteristics of Superior Students (SRBCSS), and Parent Checklists. Found that Raven's SPM was an effective screening test, and the WISC-R the best measure to…
Descriptors: Academically Gifted, Foreign Countries, Gifted, Intelligence Tests
Peer reviewedLuiselli, James K.; Campbell, Susan; Cannon, Barbara; DiPietro, Ellette; Ellis, James T.; Taras, Marie; Lifter, Karin – Research in Developmental Disabilities, 2001
Data from 30 national service centers found the number of assessment instruments endorsed increased as centers adopted a multidisciplinary approach to education and treatment, the largest proportion of instruments fell within intellectual, motor, and language/communication domains, and instruments were used most frequently for diagnostic and…
Descriptors: Adults, Autism, Children, Cognitive Development
Blakemore, Thomas; And Others – 1984
This manuscript was written to provide rehabilitation professionals, and vocational evaluation practitioners in particular, with information about learning style assessment instruments. The first section of the guide consists of a literature review that focuses on such aspects of development of the learning styles concept as individual…
Descriptors: Cognitive Measurement, Cognitive Style, Cognitive Tests, Evaluation Criteria


