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Su, Shiyang; Wang, Chun; Weiss, David J. – Educational and Psychological Measurement, 2021
S-X[superscript 2] is a popular item fit index that is available in commercial software packages such as "flex"MIRT. However, no research has systematically examined the performance of S-X[superscript 2] for detecting item misfit within the context of the multidimensional graded response model (MGRM). The primary goal of this study was…
Descriptors: Statistics, Goodness of Fit, Test Items, Models
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Chon, Kyong Hee; Lee, Won-Chan; Ansley, Timothy N. – Applied Measurement in Education, 2013
Empirical information regarding performance of model-fit procedures has been a persistent need in measurement practice. Statistical procedures for evaluating item fit were applied to real test examples that consist of both dichotomously and polytomously scored items. The item fit statistics used in this study included the PARSCALE's G[squared],…
Descriptors: Test Format, Test Items, Item Analysis, Goodness of Fit
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Zu, Jiyun; Yuan, Ke-Hai – Journal of Educational Measurement, 2012
In the nonequivalent groups with anchor test (NEAT) design, the standard error of linear observed-score equating is commonly estimated by an estimator derived assuming multivariate normality. However, real data are seldom normally distributed, causing this normal estimator to be inconsistent. A general estimator, which does not rely on the…
Descriptors: Sample Size, Equated Scores, Test Items, Error of Measurement