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Chen, Yunxiao; Lee, Yi-Hsuan; Li, Xiaoou – Journal of Educational and Behavioral Statistics, 2022
In standardized educational testing, test items are reused in multiple test administrations. To ensure the validity of test scores, the psychometric properties of items should remain unchanged over time. In this article, we consider the sequential monitoring of test items, in particular, the detection of abrupt changes to their psychometric…
Descriptors: Standardized Tests, Test Items, Test Validity, Scores
Lu, Jing; Wang, Chun – Journal of Educational Measurement, 2020
Item nonresponses are prevalent in standardized testing. They happen either when students fail to reach the end of a test due to a time limit or quitting, or when students choose to omit some items strategically. Oftentimes, item nonresponses are nonrandom, and hence, the missing data mechanism needs to be properly modeled. In this paper, we…
Descriptors: Item Response Theory, Test Items, Standardized Tests, Responses
Jing Lu; Chun Wang; Ningzhong Shi – Grantee Submission, 2023
In high-stakes, large-scale, standardized tests with certain time limits, examinees are likely to engage in either one of the three types of behavior (e.g., van der Linden & Guo, 2008; Wang & Xu, 2015): solution behavior, rapid guessing behavior, and cheating behavior. Oftentimes examinees do not always solve all items due to various…
Descriptors: High Stakes Tests, Standardized Tests, Guessing (Tests), Cheating
Yen, Wendy M. – 1982
The three-parameter logistic model discussed was used by CTB/McGraw-Hill in the development of the Comprehensive Tests of Basic Skills, Form U (CTBS/U) and the Test of Cognitive Skills (TCS), published in the fall of 1981. The development, standardization, and scoring of the tests are described, particularly as these procedures were influenced by…
Descriptors: Achievement Tests, Bayesian Statistics, Cognitive Processes, Data Collection

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