NotesFAQContact Us
Collection
Advanced
Search Tips
Descriptor
Bayesian Statistics1
Educational Testing1
Markov Processes1
Multiple Choice Tests1
Probability1
Test Items1
Education Level
Audience
Location
Laws, Policies, & Programs
Assessments and Surveys
What Works Clearinghouse Rating
Showing one result Save | Export
Peer reviewed Peer reviewed
Direct linkDirect link
Sinharay, Sandip; Johnson, Matthew S.; Williamson, David M. – Journal of Educational and Behavioral Statistics, 2003
Item families, which are groups of related items, are becoming increasingly popular in complex educational assessments. For example, in automatic item generation (AIG) systems, a test may consist of multiple items generated from each of a number of item models. Item calibration or scoring for such an assessment requires fitting models that can…
Descriptors: Test Items, Markov Processes, Educational Testing, Probability