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Yen, Wendy M. – 1982
The three-parameter logistic model discussed was used by CTB/McGraw-Hill in the development of the Comprehensive Tests of Basic Skills, Form U (CTBS/U) and the Test of Cognitive Skills (TCS), published in the fall of 1981. The development, standardization, and scoring of the tests are described, particularly as these procedures were influenced by…
Descriptors: Achievement Tests, Bayesian Statistics, Cognitive Processes, Data Collection
Pechenizkiy, Mykola; Calders, Toon; Conati, Cristina; Ventura, Sebastian; Romero, Cristobal; Stamper, John – International Working Group on Educational Data Mining, 2011
The 4th International Conference on Educational Data Mining (EDM 2011) brings together researchers from computer science, education, psychology, psychometrics, and statistics to analyze large datasets to answer educational research questions. The conference, held in Eindhoven, The Netherlands, July 6-9, 2011, follows the three previous editions…
Descriptors: Academic Achievement, Logical Thinking, Profiles, Tutoring
Kim, JinGyu – 1993
Research on the major computerized adaptive testing (CAT) strategies is reviewed, and some findings are reported that examine effects of examinee demographic and psychological characteristics on CAT strategies. In fixed branching strategies, all examinees respond to a common routing test, the score of which is used to assign examinees to a…
Descriptors: Ability, Adaptive Testing, Affective Behavior, Age Differences