Testing item-level fit is important in scale development to guide item revision/deletion. Many item-level fit indices have been proposed in literature, yet none of them were directly applicable to an important family of models, namely, the higher order item response theory (HO-IRT) models. In this study, chi-square-based fit indices (i.e., Yen's…

Item nonresponses are prevalent in standardized testing. They happen either when students fail to reach the end of a test due to a time limit or quitting, or when students choose to omit some items strategically. Oftentimes, item nonresponses are nonrandom, and hence, the missing data mechanism needs to be properly modeled. In this paper, we…

The item response times (RTs) collected from computerized testing represent an underutilized type of information about items and examinees. In addition to knowing the examinees' responses to each item, we can investigate the amount of time examinees spend on each item. Current models for RTs mainly focus on parametric models, which have the…