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Download full textLin, Chuan-Ju – Journal of Technology, Learning, and Assessment, 2010
Assembling equivalent test forms with minimal test overlap across forms is important in ensuring test security. Chen and Lei (2009) suggested a exposure control technique to control test overlap-ordered item pooling on the fly based on the essence that test overlap rate--ordered item pooling for the first t examinees is a function of test overlap…
Descriptors: Test Length, Test Format, Evaluation Criteria, Psychometrics
Scalise, Kathleen; Gifford, Bernard – Journal of Technology, Learning, and Assessment, 2006
Technology today offers many new opportunities for innovation in educational assessment through rich new assessment tasks and potentially powerful scoring, reporting and real-time feedback mechanisms. One potential limitation for realizing the benefits of computer-based assessment in both instructional assessment and large scale testing comes in…
Descriptors: Electronic Learning, Educational Assessment, Information Technology, Classification
Ketterlin-Geller, Leanne R. – Journal of Technology, Learning, and Assessment, 2005
Universal design for assessment (UDA) is intended to increase participation of students with disabilities and English-language learners in general education assessments by addressing student needs through customized testing platforms. Computer-based testing provides an optimal format for creating individually-tailored tests. However, although a…
Descriptors: Student Needs, Disabilities, Grade 3, Second Language Learning
