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Download full textGabbay, Hagit; Cohen, Anat – International Educational Data Mining Society, 2023
In MOOCs for programming, Automated Testing and Feedback (ATF) systems are frequently integrated, providing learners with immediate feedback on code assignments. The analysis of the large amounts of trace data collected by these systems may provide insights into learners' patterns of utilizing the automated feedback, which is crucial for the…
Descriptors: MOOCs, Feedback (Response), Teaching Methods, Learning Strategies
Boyer, Kristy Elizabeth, Ed.; Yudelson, Michael, Ed. – International Educational Data Mining Society, 2018
The 11th International Conference on Educational Data Mining (EDM 2018) is held under the auspices of the International Educational Data Mining Society at the Templeton Landing in Buffalo, New York. This year's EDM conference was highly competitive, with 145 long and short paper submissions. Of these, 23 were accepted as full papers and 37…
Descriptors: Data Collection, Data Analysis, Computer Science Education, Program Proposals
Hu, Xiangen, Ed.; Barnes, Tiffany, Ed.; Hershkovitz, Arnon, Ed.; Paquette, Luc, Ed. – International Educational Data Mining Society, 2017
The 10th International Conference on Educational Data Mining (EDM 2017) is held under the auspices of the International Educational Data Mining Society at the Optics Velley Kingdom Plaza Hotel, Wuhan, Hubei Province, in China. This years conference features two invited talks by: Dr. Jie Tang, Associate Professor with the Department of Computer…
Descriptors: Data Analysis, Data Collection, Graphs, Data Use
Stamper, John, Ed.; Pardos, Zachary, Ed.; Mavrikis, Manolis, Ed.; McLaren, Bruce M., Ed. – International Educational Data Mining Society, 2014
The 7th International Conference on Education Data Mining held on July 4th-7th, 2014, at the Institute of Education, London, UK is the leading international forum for high-quality research that mines large data sets in order to answer educational research questions that shed light on the learning process. These data sets may come from the traces…
Descriptors: Information Retrieval, Data Processing, Data Analysis, Data Collection
