Publication Date
| In 2026 | 0 |
| Since 2025 | 0 |
| Since 2022 (last 5 years) | 1 |
| Since 2017 (last 10 years) | 3 |
| Since 2007 (last 20 years) | 6 |
Descriptor
| Goodness of Fit | 9 |
| Statistical Analysis | 9 |
| Test Length | 9 |
| Item Response Theory | 7 |
| Sample Size | 6 |
| Test Items | 6 |
| Comparative Analysis | 3 |
| Error of Measurement | 3 |
| Models | 3 |
| Classification | 2 |
| Computation | 2 |
| More ▼ | |
Author
| Abad, Francisco J. | 1 |
| Chen, Cheng-Te | 1 |
| Chen, Troy T. | 1 |
| De Champlain, Andre F. | 1 |
| DeMars, Christine | 1 |
| Deng, Nina | 1 |
| Gessaroli, Marc E. | 1 |
| Haimiao Yuan | 1 |
| Hutten, Leah R. | 1 |
| Kang, Taehoon | 1 |
| Sauder, Derek | 1 |
| More ▼ | |
Publication Type
| Reports - Research | 5 |
| Journal Articles | 4 |
| Dissertations/Theses -… | 2 |
| Reports - Evaluative | 2 |
| Speeches/Meeting Papers | 2 |
Education Level
Audience
Location
Laws, Policies, & Programs
Assessments and Surveys
What Works Clearinghouse Rating
Haimiao Yuan – ProQuest LLC, 2022
The application of diagnostic classification models (DCMs) in the field of educational measurement is getting more attention in recent years. To make a valid inference from the model, it is important to ensure that the model fits the data. The purpose of the present study was to investigate the performance of the limited information…
Descriptors: Goodness of Fit, Educational Assessment, Educational Diagnosis, Models
Su, Shiyang; Wang, Chun; Weiss, David J. – Educational and Psychological Measurement, 2021
S-X[superscript 2] is a popular item fit index that is available in commercial software packages such as "flex"MIRT. However, no research has systematically examined the performance of S-X[superscript 2] for detecting item misfit within the context of the multidimensional graded response model (MGRM). The primary goal of this study was…
Descriptors: Statistics, Goodness of Fit, Test Items, Models
Sauder, Derek; DeMars, Christine – Applied Measurement in Education, 2020
We used simulation techniques to assess the item-level and familywise Type I error control and power of an IRT item-fit statistic, the "S-X"[superscript 2]. Previous research indicated that the "S-X"[superscript 2] has good Type I error control and decent power, but no previous research examined familywise Type I error control.…
Descriptors: Item Response Theory, Test Items, Sample Size, Test Length
Sueiro, Manuel J.; Abad, Francisco J. – Educational and Psychological Measurement, 2011
The distance between nonparametric and parametric item characteristic curves has been proposed as an index of goodness of fit in item response theory in the form of a root integrated squared error index. This article proposes to use the posterior distribution of the latent trait as the nonparametric model and compares the performance of an index…
Descriptors: Goodness of Fit, Item Response Theory, Nonparametric Statistics, Probability
Deng, Nina – ProQuest LLC, 2011
Three decision consistency and accuracy (DC/DA) methods, the Livingston and Lewis (LL) method, LEE method, and the Hambleton and Han (HH) method, were evaluated. The purposes of the study were: (1) to evaluate the accuracy and robustness of these methods, especially when their assumptions were not well satisfied, (2) to investigate the "true"…
Descriptors: Item Response Theory, Test Theory, Computation, Classification
Kang, Taehoon; Chen, Troy T. – ACT, Inc., 2007
Orlando and Thissen (2000, 2003) proposed an item-fit index, S-X[superscript 2], for dichotomous item response theory (IRT) models, which has performed better than traditional item-fit statistics such as Yen's (1981) Q[subscript 1] and McKinley and Mill's (1985) G[superscript 2]. This study extends the utility of S-X[superscript 2] to polytomous…
Descriptors: Item Response Theory, Models, Computer Software, Statistical Analysis
De Champlain, Andre F.; Gessaroli, Marc E. – 1997
A study was conducted to compare, with simulated unidimensional and two-dimensional sets, the Type I error probabilities and rejection rates obtained with two versions of the LISREL computer program, the earlier version PRELIS/LISREL 7 and the later version PRELIS2/LISREL8, a version that corrects the asymptotic covariance matrix. Unidimensional…
Descriptors: Chi Square, Comparative Analysis, Goodness of Fit, Item Response Theory
Wang, Wen-Chung; Chen, Cheng-Te – Educational and Psychological Measurement, 2005
This study investigates item parameter recovery, standard error estimates, and fit statistics yielded by the WINSTEPS program under the Rasch model and the rating scale model through Monte Carlo simulations. The independent variables were item response model, test length, and sample size. WINSTEPS yielded practically unbiased estimates for the…
Descriptors: Statistics, Test Length, Rating Scales, Item Response Theory
Hutten, Leah R. – 1979
Goodness of fit of raw test score data were compared, using two latent trait models: the Rasch model and the Birnbaum three-parameter logistic model. Data were taken from various achievement tests and the Scholastic Aptitude Test (Verbal). A minimum sample size of 1,000 was required, and the minimum test length was 40 items. Results indicated that…
Descriptors: Ability Identification, Achievement Tests, College Entrance Examinations, Comparative Analysis

Direct link
Peer reviewed
