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Tatsuoka, Kikumi; Linn, Robert L. – 1981
Two distinct approaches, one based on item response theory and the other based on observed item responses and standard summary statistics, have been proposed to identify unusual response patterns. A link between these two approaches is provided by showing certain correspondences between Sato's S-P Curve Theory and item response theory. This link…
Descriptors: Arithmetic, Computer Assisted Testing, Latent Trait Theory, Matrices
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Nietfeld, John L.; Enders, Craig K; Schraw, Gregory – Educational and Psychological Measurement, 2006
Researchers studying monitoring accuracy currently use two different indexes to estimate accuracy: relative accuracy and absolute accuracy. The authors compared the distributional properties of two measures of monitoring accuracy using Monte Carlo procedures that fit within these categories. They manipulated the accuracy of judgments (i.e., chance…
Descriptors: Monte Carlo Methods, Test Items, Computation, Metacognition
Cliff, Norman; And Others – 1977
TAILOR is a computer program that uses the implied orders concept as the basis for computerized adaptive testing. The basic characteristics of TAILOR, which does not involve pretesting, are reviewed here and two studies of it are reported. One is a Monte Carlo simulation based on the four-parameter Birnbaum model and the other uses a matrix of…
Descriptors: Adaptive Testing, Computer Assisted Testing, Computer Programs, Difficulty Level
Tatsuoka, Kikumi K.; Tatsuoka, Maurice M. – 1978
The family of Weibull distributions was investigated as a model for the distributions of response times for items in computer-based criterion-referenced tests. The fit of these distributions were, with a few exceptions, good to excellent according to the Kolmogorov-Smirnov test. For a few relatively simple items, the two-parameter gamma…
Descriptors: Career Development, Computer Assisted Instruction, Computer Assisted Testing, Criterion Referenced Tests
Barnes, Tiffany, Ed.; Desmarais, Michel, Ed.; Romero, Cristobal, Ed.; Ventura, Sebastian, Ed. – International Working Group on Educational Data Mining, 2009
The Second International Conference on Educational Data Mining (EDM2009) was held at the University of Cordoba, Spain, on July 1-3, 2009. EDM brings together researchers from computer science, education, psychology, psychometrics, and statistics to analyze large data sets to answer educational research questions. The increase in instrumented…
Descriptors: Data Analysis, Educational Research, Conferences (Gatherings), Foreign Countries
Stamper, John, Ed.; Pardos, Zachary, Ed.; Mavrikis, Manolis, Ed.; McLaren, Bruce M., Ed. – International Educational Data Mining Society, 2014
The 7th International Conference on Education Data Mining held on July 4th-7th, 2014, at the Institute of Education, London, UK is the leading international forum for high-quality research that mines large data sets in order to answer educational research questions that shed light on the learning process. These data sets may come from the traces…
Descriptors: Information Retrieval, Data Processing, Data Analysis, Data Collection