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Direct linkSu, Shiyang; Wang, Chun; Weiss, David J. – Educational and Psychological Measurement, 2021
S-X[superscript 2] is a popular item fit index that is available in commercial software packages such as "flex"MIRT. However, no research has systematically examined the performance of S-X[superscript 2] for detecting item misfit within the context of the multidimensional graded response model (MGRM). The primary goal of this study was…
Descriptors: Statistics, Goodness of Fit, Test Items, Models
Download full textBrown, Joel M.; Weiss, David J. – 1977
An adaptive testing strategy is described for achievement tests covering multiple content areas. The strategy combines adaptive item selection both within and between the subtests in the multiple-subtest battery. A real-data simulation was conducted to compare the results from adaptive testing and from conventional testing, in terms of test…
Descriptors: Achievement Tests, Adaptive Testing, Branching, Comparative Analysis
