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Reckase, Mark D. – 1978
Five comparisons were made relative to the quality of estimates of ability parameters and item calibrations obtained from the one-parameter and three-parameter logistic models. The results indicate: (1) The three-parameter model fit the test data better in all cases than did the one-parameter model. For simulation data sets, multi-factor data were…
Descriptors: Comparative Analysis, Goodness of Fit, Item Analysis, Mathematical Models
Eignor, Daniel R.; Hambleton, Ronald K. – 1979
The purpose of the investigation was to obtain some relationships among (1) test lengths, (2) shape of domain-score distributions, (3) advancement scores, and (4) several criterion-referenced test score reliability and validity indices. The study was conducted using computer simulation methods. The values of variables under study were set to be…
Descriptors: Comparative Analysis, Computer Assisted Testing, Criterion Referenced Tests, Cutting Scores
Merz, William R.; Grossen, Neal E. – 1978
Six approaches to assessing test item bias were examined: transformed item difficulty, point biserial correlations, chi-square, factor analysis, one parameter item characteristic curve, and three parameter item characteristic curve. Data sets for analysis were generated by a Monte Carlo technique based on the three parameter model; thus, four…
Descriptors: Difficulty Level, Evaluation Methods, Factor Analysis, Item Analysis
PDF pending restorationCivil Service Commission, Washington, DC. Personnel Research and Development Center. – 1976
This pamphlet reprints three papers and an invited discussion of them, read at a Division 5 Symposium at the 1975 American Psychological Association Convention. The first paper describes a Bayesian tailored testing process and shows how it demonstrates the importance of using test items with high discrimination, low guessing probability, and a…
Descriptors: Adaptive Testing, Bayesian Statistics, Computer Oriented Programs, Computer Programs
Cliff, Norman; And Others – 1977
TAILOR is a computer program that uses the implied orders concept as the basis for computerized adaptive testing. The basic characteristics of TAILOR, which does not involve pretesting, are reviewed here and two studies of it are reported. One is a Monte Carlo simulation based on the four-parameter Birnbaum model and the other uses a matrix of…
Descriptors: Adaptive Testing, Computer Assisted Testing, Computer Programs, Difficulty Level


