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Matthew J. Madison; Seungwon Chung; Junok Kim; Laine P. Bradshaw – Grantee Submission, 2023
Recent developments have enabled the modeling of longitudinal assessment data in a diagnostic classification model (DCM) framework. These longitudinal DCMs were developed to provide measures of student growth on a discrete scale in the form of attribute mastery transitions, thereby supporting categorical and criterion-referenced interpretations of…
Descriptors: Models, Cognitive Measurement, Diagnostic Tests, Classification
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Henson, Robert; DiBello, Lou; Stout, Bill – Measurement: Interdisciplinary Research and Perspectives, 2018
Diagnostic classification models (DCMs, also known as cognitive diagnosis models) hold the promise of providing detailed classroom information about the skills a student has or has not mastered. Specifically, DCMs are special cases of constrained latent class models where classes are defined based on mastery/nonmastery of a set of attributes (or…
Descriptors: Classification, Diagnostic Tests, Models, Mastery Learning
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Culpepper, Steven Andrew – Journal of Educational and Behavioral Statistics, 2015
A Bayesian model formulation of the deterministic inputs, noisy "and" gate (DINA) model is presented. Gibbs sampling is employed to simulate from the joint posterior distribution of item guessing and slipping parameters, subject attribute parameters, and latent class probabilities. The procedure extends concepts in Béguin and Glas,…
Descriptors: Bayesian Statistics, Models, Sampling, Computation
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de la Torre, Jimmy – Applied Psychological Measurement, 2009
Cognitive or skills diagnosis models are discrete latent variable models developed specifically for the purpose of identifying the presence or absence of multiple fine-grained skills. However, applications of these models typically involve dichotomous or dichotomized data, including data from multiple-choice (MC) assessments that are scored as…
Descriptors: Cognitive Measurement, Thinking Skills, Identification, Multiple Choice Tests
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Finch, Holmes – Journal of Educational Measurement, 2008
Missing data are a common problem in a variety of measurement settings, including responses to items on both cognitive and affective assessments. Researchers have shown that such missing data may create problems in the estimation of item difficulty parameters in the Item Response Theory (IRT) context, particularly if they are ignored. At the same…
Descriptors: Simulation, Item Response Theory, Researchers, Computation
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Templin, Jonathan L.; Henson, Robert A.; Templin, Sara E.; Roussos, Louis – Applied Psychological Measurement, 2008
Several types of parameterizations of attribute correlations in cognitive diagnosis models use the reduced reparameterized unified model. The general approach presumes an unconstrained correlation matrix with K(K - 1)/2 parameters, whereas the higher order approach postulates K parameters, imposing a unidimensional structure on the correlation…
Descriptors: Factor Structure, Identification, Correlation, Computation
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Henson, Robert; Templin, Jonathan; Douglas, Jeffrey – Journal of Educational Measurement, 2007
Consider test data, a specified set of dichotomous skills measured by the test, and an IRT cognitive diagnosis model (ICDM). Statistical estimation of the data set using the ICDM can provide examinee estimates of mastery for these skills, referred to generally as attributes. With such detailed information about each examinee, future instruction…
Descriptors: Simulation, Teaching Methods, Testing, Diagnostic Tests