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Liu, Ran; Koedinger, Kenneth R. – International Educational Data Mining Society, 2015
A growing body of research suggests that accounting for student specific variability in educational data can improve modeling accuracy and may have implications for individualizing instruction. The Additive Factors Model (AFM), a logistic regression model used to fit educational data and discover/refine skill models of learning, contains a…
Descriptors: Models, Regression (Statistics), Learning, Classification
Peer reviewedBraun, Henry I.; Szatrowski, Ted H. – Journal of Educational Statistics, 1984
A universal criterion scale is applied to the direct estimation of validity for various groups of law school applicants and to the testing of the assumptions underlying the more familiar extrapolation methods. Data from American law schools are used to illustrate the procedures. (Author/BW)
Descriptors: Bayesian Statistics, College Entrance Examinations, Equated Scores, Grading
Peer reviewedDunbar, Stephen B.; And Others – Journal of Educational Statistics, 1986
This paper considers the application of Bayesian techniques for simultaneous estimation to the specification of regression weights for selection tests used in various technical training courses in the Marine Corps. It concludes that a hypothesis of complete generalization of the predictor-criterion relationship would only be retained for selected…
Descriptors: Bayesian Statistics, Clerical Occupations, Electrical Occupations, Estimation (Mathematics)
Peer reviewedZwick, Rebecca – Journal of Educational Statistics, 1993
A validity study with 5,219 students examined the degree to which Graduate Management Admission Test (GMAT) scores and undergraduate grade point average (GPA) could predict first-year average and final GPA in doctoral programs in business. The usefulness of the predictions derived from the empirical Bayes regression models is discussed. (SLD)
Descriptors: Administrator Education, Admission Criteria, Bayesian Statistics, Business Education
Pechenizkiy, Mykola; Calders, Toon; Conati, Cristina; Ventura, Sebastian; Romero, Cristobal; Stamper, John – International Working Group on Educational Data Mining, 2011
The 4th International Conference on Educational Data Mining (EDM 2011) brings together researchers from computer science, education, psychology, psychometrics, and statistics to analyze large datasets to answer educational research questions. The conference, held in Eindhoven, The Netherlands, July 6-9, 2011, follows the three previous editions…
Descriptors: Academic Achievement, Logical Thinking, Profiles, Tutoring


