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Shear, Benjamin R. – Journal of Educational Measurement, 2018
When contextual features of test-taking environments differentially affect item responding for different test takers and these features vary across test administrations, they may cause differential item functioning (DIF) that varies across test administrations. Because many common DIF detection methods ignore potential DIF variance, this article…
Descriptors: Test Bias, Regression (Statistics), Hierarchical Linear Modeling