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Direct linkChalmers, R. Philip; Zheng, Guoguo – Applied Measurement in Education, 2023
This article presents generalizations of SIBTEST and crossing-SIBTEST statistics for differential item functioning (DIF) investigations involving more than two groups. After reviewing the original two-group setup for these statistics, a set of multigroup generalizations that support contrast matrices for joint tests of DIF are presented. To…
Descriptors: Test Bias, Test Items, Item Response Theory, Error of Measurement
Abulela, Mohammed A. A.; Rios, Joseph A. – Applied Measurement in Education, 2022
When there are no personal consequences associated with test performance for examinees, rapid guessing (RG) is a concern and can differ between subgroups. To date, the impact of differential RG on item-level measurement invariance has received minimal attention. To that end, a simulation study was conducted to examine the robustness of the…
Descriptors: Comparative Analysis, Robustness (Statistics), Nonparametric Statistics, Item Analysis
Rutkowski, Leslie – Applied Measurement in Education, 2014
Large-scale assessment programs such as the National Assessment of Educational Progress (NAEP), Trends in International Mathematics and Science Study (TIMSS), and Programme for International Student Assessment (PISA) use a sophisticated assessment administration design called matrix sampling that minimizes the testing burden on individual…
Descriptors: Measurement, Testing, Item Sampling, Computation
