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Peer reviewedZhang, Jinming; Stout, William – Psychometrika, 1997
Three counterexamples demonstrate that the Dutch Identity conjecture of P. Holland about examinee ability (1990) does not hold in general. The counterexamples suggest that only under strong assumptions can it be true that the limits of log-manifest probabilities are quadratic. Three propositions giving such strong conditions are given. (Author/SLD)
Descriptors: Ability, Item Response Theory, Mathematical Models, Probability
Peer reviewedWilcox, Rand R. – Educational and Psychological Measurement, 1979
Wilcox has described three probability models which characterize a single test item in terms of a population of examinees (ED 156 718). This note indicates indicates that similar models can be derived which characterize a single examinee in terms of an item domain. A numerical illustration is given. (Author/JKS)
Descriptors: Achievement Tests, Item Analysis, Mathematical Models, Probability
Epstein, Kenneth I. – 1975
Since the primary purpose of classical testing is to rank order examinees consistently, the absolute value of the true score has been relatively unimportant. However, the major purpose of criterion referenced testing is to estimate the true capabilities of examinees to perform specific tasks. Hence, the problems of true score determination assume…
Descriptors: Bayesian Statistics, Criterion Referenced Tests, Mathematical Models, Military Personnel
Peer reviewedvan der Linden, Wim J. – Applied Psychological Measurement, 1979
The restrictions on item difficulties that must be met when binomial models are applied to domain-referenced testing are examined. Both a deterministic and a stochastic conception of item responses are discussed with respect to difficulty and Guttman-type items. (Author/BH)
Descriptors: Difficulty Level, Item Sampling, Latent Trait Theory, Mathematical Models
Besel, Ronald – 1973
The contention is made that group performance data are useful in the construction and interpretation of criterion-referenced tests. The Mastery Learning Test Model, which was developed for analyzing criterion-referenced test data, is described. An estimate of the proportion of students in an instructional group having achieved the referent…
Descriptors: Algorithms, Correlation, Criterion Referenced Tests, Decision Making
Besel, Ronald – 1971
The assumptions of the Criterion-Referenced Test (CRT) model proposed by Kriewall are compared to those of Emrick and Adam's Mastery-Learning (ML) model. Testing, in the context of instructional management, serves three general purposes: performance evaluation (achievement of objectives), placement (classification of students for instruction), and…
Descriptors: Bayesian Statistics, Comparative Analysis, Criterion Referenced Tests, Cutting Scores
Steinheiser, Frederick, Jr. – 1975
Summarizing work which is part of an Army research program on Methodological Issues in the Construction of Criterion Referenced Tests, the focus of this paper is on a Bayesian model, which gives the probability of correctly classifying an examiner as a master or as a nonmaster while taking into consideration the test length and the mastery cut-off…
Descriptors: Ability, Achievement, Bayesian Statistics, Classification
Besel, Ronald – 1971
The Mastery-Learning test model is extended. Methods for estimating prior probabilities are described. The use of an adjustment matrix to transform a probability of mastery measure and empirical methods for estimating adjustment matrix parameters are derived. Adjustment matrices are interpreted as indicators of instructional effectiveness and as…
Descriptors: Criterion Referenced Tests, Decision Making, Groups, Individual Testing
Hambleton, Ronald K.; And Others – 1977
Latent trait theory supposes that, in testing situations, examinee performance on a test can be predicted (or explained) by defining examinee characteristics, referred to as traits, estimating scores for examinees on these traits and using the scores to predict or explain test performance (Lord and Novick, 1968). In view of the breakthroughs in…
Descriptors: Adaptive Testing, Bayesian Statistics, Cognitive Measurement, Computer Programs


