The empirical Bayes modeling approach--latent ability random sampling in the item response theory (IRT) context--to the IRT modeling of psychological tests is described. Under the usual empirical Bayes unidimensional IRT modeling approach, the posterior distribution of examinee ability given test response is approximately normal for a long test.…

Two procedures for classifying examinees into categories, one based on the sequential probability ratio test (SPRT) and the other on sequential Bayes methodology, were compared to determine which required fewer items for classification. Results showed that the SPRT procedure requires fewer items to achieve the same accuracy level. (SLD)

The asymptotic posterior normality of latent variable distributions is established under very general and appropriate hypotheses, providing a probabilistic basis for assessing ability estimation/prediction accuracy in the long test case, as well as a first step in making the Dutch Identity conjecture rigorous. (SLD)

Owen's Bayesian tailored testing method is introduced along with a brief review of its derivation. The characteristics of a good item bank are outlined and explored in terms of their influence on the Bayesian tailoring process. (Author/RC)

Hierarchical Bayes procedures were compared for estimating item and ability parameters in item response theory. Simulated data sets from the two-parameter logistic model were analyzed using three different hierarchical Bayes procedures: (1) the joint Bayesian with known hyperparameters (JB1); (2) the joint Bayesian with information hyperpriors…

Summarizing work which is part of an Army research program on Methodological Issues in the Construction of Criterion Referenced Tests, the focus of this paper is on a Bayesian model, which gives the probability of correctly classifying an examiner as a master or as a nonmaster while taking into consideration the test length and the mastery cut-off…

Topics concerning latent trait theory are addressed: (1) dimensionality of latent space, local independence, and item characteristic curves; (2) models--equations, parameter estimation, testing assumptions, and goodness of fit, (3) applications test developments, item bias, tailored testing and equating; and (4) advantages over classical…