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Lozano, José H.; Revuelta, Javier – Educational and Psychological Measurement, 2023
The present paper introduces a general multidimensional model to measure individual differences in learning within a single administration of a test. Learning is assumed to result from practicing the operations involved in solving the items. The model accounts for the possibility that the ability to learn may manifest differently for correct and…
Descriptors: Bayesian Statistics, Learning Processes, Test Items, Item Analysis
Patel, Nirmal; Sharma, Aditya; Shah, Tirth; Lomas, Derek – Journal of Educational Data Mining, 2021
Process Analysis is an emerging approach to discover meaningful knowledge from temporal educational data. The study presented in this paper shows how we used Process Analysis methods on the National Assessment of Educational Progress (NAEP) test data for modeling and predicting student test-taking behavior. Our process-oriented data exploration…
Descriptors: Learning Analytics, National Competency Tests, Evaluation Methods, Prediction
Boxuan Ma; Sora Fukui; Yuji Ando; Shinichi Konomi – Journal of Educational Data Mining, 2024
Language proficiency diagnosis is essential to extract fine-grained information about the linguistic knowledge states and skill mastery levels of test takers based on their performance on language tests. Different from comprehensive standardized tests, many language learning apps often revolve around word-level questions. Therefore, knowledge…
Descriptors: Language Proficiency, Brain Hemisphere Functions, Language Processing, Task Analysis
Chu, Wei; Pavlik, Philip I., Jr. – International Educational Data Mining Society, 2023
In adaptive learning systems, various models are employed to obtain the optimal learning schedule and review for a specific learner. Models of learning are used to estimate the learner's current recall probability by incorporating features or predictors proposed by psychological theory or empirically relevant to learners' performance. Logistic…
Descriptors: Reaction Time, Accuracy, Models, Predictor Variables

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