Descriptor
| Algorithms | 1 |
| Models | 1 |
| Reliability | 1 |
| Test Construction | 1 |
| Test Length | 1 |
| Test Theory | 1 |
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| Applied Psychological… | 1 |
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| Journal Articles | 1 |
| Reports - Descriptive | 1 |
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Peer reviewedSanders, Piet F.; Verschoor, Alfred J. – Applied Psychological Measurement, 1998
Presents minimization and maximization models for parallel test construction under constraints. The minimization model constructs weakly and strongly parallel tests of minimum length, while the maximization model constructs weakly and strongly parallel tests with maximum test reliability. (Author/SLD)
Descriptors: Algorithms, Models, Reliability, Test Construction
