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Enders, Craig K. – Guilford Press, 2010
Walking readers step by step through complex concepts, this book translates missing data techniques into something that applied researchers and graduate students can understand and utilize in their own research. Enders explains the rationale and procedural details for maximum likelihood estimation, Bayesian estimation, multiple imputation, and…
Descriptors: Data Analysis, Error of Measurement, Research Problems, Maximum Likelihood Statistics
Yen, Wendy M. – 1982
The three-parameter logistic model discussed was used by CTB/McGraw-Hill in the development of the Comprehensive Tests of Basic Skills, Form U (CTBS/U) and the Test of Cognitive Skills (TCS), published in the fall of 1981. The development, standardization, and scoring of the tests are described, particularly as these procedures were influenced by…
Descriptors: Achievement Tests, Bayesian Statistics, Cognitive Processes, Data Collection

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