Descriptor
Mathematical Models | 20 |
Monte Carlo Methods | 20 |
Test Items | 20 |
Computer Simulation | 8 |
Difficulty Level | 7 |
Comparative Analysis | 6 |
Equations (Mathematics) | 6 |
Item Response Theory | 6 |
Error of Measurement | 5 |
Item Bias | 5 |
Scoring | 5 |
More ▼ |
Source
Applied Psychological… | 3 |
Journal of Educational… | 3 |
Educational and Psychological… | 2 |
Multivariate Behavioral… | 1 |
Psychometrika | 1 |
Author
Kromrey, Jeffrey D. | 3 |
Ackerman, Terry A. | 2 |
Bacon, Tina P. | 1 |
Carlson, James E. | 1 |
Cliff, Norman | 1 |
Clingman, Joy M. | 1 |
Donoghue, John R. | 1 |
Du Bose, Pansy | 1 |
Evans, John A. | 1 |
Fowler, Robert L. | 1 |
Gressard, Risa P. | 1 |
More ▼ |
Publication Type
Journal Articles | 10 |
Reports - Evaluative | 10 |
Reports - Research | 9 |
Speeches/Meeting Papers | 9 |
Reports - Descriptive | 1 |
Education Level
Audience
Researchers | 3 |
Location
Laws, Policies, & Programs
Assessments and Surveys
ACT Assessment | 1 |
What Works Clearinghouse Rating

Hattie, John – Multivariate Behavioral Research, 1984
This paper describes a simulation that determines the adequacy of various indices as decision criteria for assessing unidimensionality. Using the sum of absolute residuals from the two-parameter latent trait model, indices were obtained that could discriminate between one latent trait and more than one latent trait. (Author/BW)
Descriptors: Achievement Tests, Latent Trait Theory, Mathematical Models, Monte Carlo Methods

Molenaar, Ivo W.; Hoijtink, Herbert – Psychometrika, 1990
Statistical properties of person fit indices are reviewed as indicators of the extent to which a person's score pattern is in agreement with a measurement model. Distribution of a fit index and ability-free fit evaluation are discussed. The null distribution was simulated for a test of 20 items. (SLD)
Descriptors: Item Banks, Item Response Theory, Mathematical Models, Monte Carlo Methods
Monte Carlo Based Null Distribution for an Alternative Goodness-of-Fit Test Statistic in IRT Models.

Stone, Clement A. – Journal of Educational Measurement, 2000
Describes a goodness-of-fit statistic that considers the imprecision with which ability is estimated and involves constructing item fit tables based on each examinee's posterior distribution of ability, given the likelihood of the response pattern and an assumed marginal ability distribution. Also describes a Monte Carlo resampling procedure to…
Descriptors: Goodness of Fit, Item Response Theory, Mathematical Models, Monte Carlo Methods

Gressard, Risa P.; Loyd, Brenda H. – Journal of Educational Measurement, 1991
A Monte Carlo study, which simulated 10,000 examinees' responses to four tests, investigated the effect of item stratification on parameter estimation in multiple matrix sampling of achievement data. Practical multiple matrix sampling is based on item stratification by item discrimination and a sampling plan with moderate number of subtests. (SLD)
Descriptors: Achievement Tests, Comparative Testing, Computer Simulation, Estimation (Mathematics)

Park, Dong-Gun; Lautenschlager, Gary J. – Applied Psychological Measurement, 1990
The effectiveness of two iterative methods of item response theory (IRT) item bias detection was examined in a simulation study. A modified form of the iterative item parameter linking method of F. Drasgow and an adaptation of the test purification procedure of F. M. Lord were compared. (SLD)
Descriptors: Ability Identification, Computer Simulation, Item Bias, Item Response Theory

Reise, Steven P. – Applied Psychological Measurement, 1990
To demonstrate that some methods used to assess item fit can be applied to assess person fit and vice versa, performance of a chi-squared item-fit statistic was compared with that of a likelihood-based person-fit statistic for examinees and items under Monte Carlo conditions. (SLD)
Descriptors: Chi Square, Comparative Analysis, Goodness of Fit, Item Response Theory

Huck, Schuyler W.; And Others – Educational and Psychological Measurement, 1981
Believing that examinee-by-item interaction should be conceptualized as true score variability rather than as a result of errors of measurement, Lu proposed a modification of Hoyt's analysis of variance reliability procedure. Via a computer simulation study, it is shown that Lu's approach does not separate interaction from error. (Author/RL)
Descriptors: Analysis of Variance, Comparative Analysis, Computer Programs, Difficulty Level
Ackerman, Terry A.; Evans, John A. – 1992
The relationship between levels of reliability and the power of two bias and differential item functioning (DIF) detection methods is examined. Both methods, the Mantel-Haenszel (MH) procedure of P. W. Holland and D. T. Thayer (1988) and the Simultaneous Item Bias (SIB) procedure of R. Shealy and W. Stout (1991), use examinees' raw scores as a…
Descriptors: Comparative Analysis, Equations (Mathematics), Error of Measurement, Item Bias
Kromrey, Jeffrey D.; Bacon, Tina P. – 1992
A Monte Carlo study was conducted to estimate the small sample standard errors and statistical bias of psychometric statistics commonly used in the analysis of achievement tests. The statistics examined in this research were: (1) the index of item difficulty; (2) the index of item discrimination; (3) the corrected item-total point-biserial…
Descriptors: Achievement Tests, Comparative Analysis, Difficulty Level, Estimation (Mathematics)
Jones, Patricia B.; And Others – 1987
In order to determine the effectiveness of multidimensional scaling (MDS) in recovering the dimensionality of a set of dichotomously-scored items, data were simulated in one, two, and three dimensions for a variety of correlations with the underlying latent trait. Similarity matrices were constructed from these data using three margin-sensitive…
Descriptors: Cluster Analysis, Correlation, Difficulty Level, Error of Measurement

Fowler, Robert L.; Clingman, Joy M. – Educational and Psychological Measurement, 1992
Monte Carlo techniques are used to examine the power of the "B" statistic of R. L. Brennan (1972) to detect negatively discriminating items drawn from a variety of nonnormal population distributions. A simplified procedure is offered for conducting an item-discrimination analysis on typical classroom objective tests. (SLD)
Descriptors: Classroom Techniques, Elementary Secondary Education, Equations (Mathematics), Item Analysis
Samejima, Fumiko – 1986
Item analysis data fitting the normal ogive model were simulated in order to investigate the problems encountered when applying the three-parameter logistic model. Binary item tests containing 10 and 35 items were created, and Monte Carlo methods simulated the responses of 2,000 and 500 examinees. Item parameters were obtained using Logist 5.…
Descriptors: Computer Simulation, Difficulty Level, Guessing (Tests), Item Analysis
Du Bose, Pansy; Kromrey, Jeffrey D. – 1993
Empirical evidence is presented of the relative efficiency of two potential linkage plans to be used when equivalent test forms are being administered. Equating is a process by which scores on one form of a test are converted to scores on another form of the same test. A Monte Carlo study was conducted to examine equating stability and statistical…
Descriptors: Art Education, Comparative Testing, Computer Simulation, Equated Scores

Donoghue, John R.; Cliff, Norman – Applied Psychological Measurement, 1991
The validity of the assumptions under which the ordinal true score test theory was derived was examined using (1) simulation based on classical test theory; (2) a long empirical test with data from 321 sixth graders; and (3) an extensive simulation with 480 datasets based on the 3-parameter model. (SLD)
Descriptors: Computer Simulation, Elementary Education, Elementary School Students, Equations (Mathematics)

Ackerman, Terry A. – Journal of Educational Measurement, 1992
The difference between item bias and item impact and the way they relate to item validity are discussed from a multidimensional item response theory perspective. The Mantel-Haenszel procedure and the Simultaneous Item Bias strategy are used in a Monte Carlo study to illustrate detection of item bias. (SLD)
Descriptors: Causal Models, Computer Simulation, Construct Validity, Equations (Mathematics)
Previous Page | Next Page ยป
Pages: 1 | 2