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Direct linkSinharay, Sandip; Johnson, Matthew S.; Williamson, David M. – Journal of Educational and Behavioral Statistics, 2003
Item families, which are groups of related items, are becoming increasingly popular in complex educational assessments. For example, in automatic item generation (AIG) systems, a test may consist of multiple items generated from each of a number of item models. Item calibration or scoring for such an assessment requires fitting models that can…
Descriptors: Test Items, Markov Processes, Educational Testing, Probability
Download full textJohnson, Matthew S.; Sinharay, Sandip – 2003
For complex educational assessments, there is an increasing use of "item families," which are groups of related items. However, calibration or scoring for such an assessment requires fitting models that take into account the dependence structure inherent among the items that belong to the same item family. C. Glas and W. van der Linden…
Descriptors: Bayesian Statistics, Constructed Response, Educational Assessment, Estimation (Mathematics)
