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van der Linden, Wim J.; Ren, Hao – Journal of Educational and Behavioral Statistics, 2020
The Bayesian way of accounting for the effects of error in the ability and item parameters in adaptive testing is through the joint posterior distribution of all parameters. An optimized Markov chain Monte Carlo algorithm for adaptive testing is presented, which samples this distribution in real time to score the examinee's ability and optimally…
Descriptors: Bayesian Statistics, Adaptive Testing, Error of Measurement, Markov Processes