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ERIC Number: EJ1468362
Record Type: Journal
Publication Date: 2025-Apr
Pages: 10
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-0018-9359
EISSN: EISSN-1557-9638
Available Date: 0000-00-00
Exploring the Role of Interfaces in Microcontroller Circuits: An Analysis of Students' Performance and Usability
IEEE Transactions on Education, v68 n2 p258-267 2025
Contribution: This study focuses on microcontroller circuits and aims to: 1) investigate the impact of formal reasoning on students' post-knowledge using catastrophe theory; 2) compare the different combination sequences of tangible user interface (TUI) and graphical user interface (GUI); and 3) assess the usability of both interfaces and explore potential correlations between perceived usability and students' post-knowledge. Background: Although in the existing literature, there are a few studies investigating the role of the sequence of TUI and GUI in students' post-knowledge, particularly in the microcontroller circuits there is a notable lack of related studies. Also, in this field, the effect of formal reasoning on students' post-knowledge has not been investigated. Research Questions: Does formal reasoning affect students' post-knowledge in microcontroller electronic circuits? Does interface sequence have any impact on students' post-knowledge? Does interface sequence impact students' usability perception of the TUI and GUI? Does student perceived usability correlate with their post-knowledge? Methodology: The intervention had a sample size of 134 university students who conducted four microcontroller exercises. In addition, statistical analysis employed the nonlinear Cusp catastrophe model, t-tests, and ANCOVA along with bootstrapping. Findings: Interface sequence has no impact on students' post-knowledge, while students' answers showed a significant difference in the evaluation of usability in favor of the real circuit. Cusp model showed that formal reasoning influences achievement and can act as bifurcation factor denoting that beyond a threshold value nonlinear changes in performance can occur.
Institute of Electrical and Electronics Engineers, Inc. 445 Hoes Lane, Piscataway, NJ 08854. Tel: 732-981-0060; Web site: http://ieeexplore.ieee.org.bibliotheek.ehb.be/xpl/RecentIssue.jsp?punumber=13
Publication Type: Journal Articles; Reports - Research
Education Level: Higher Education; Postsecondary Education
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A
Author Affiliations: N/A