ERIC Number: EJ1363090
Record Type: Journal
Publication Date: 2023
Pages: 16
Abstractor: As Provided
ISBN: N/A
ISSN: ISSN-0888-4080
EISSN: EISSN-1099-0720
Available Date: N/A
Interviewing to Detect Omission Lies
Leal, Sharon; Vrij, Aldert; Deeb, Haneen; Fisher, Ronald P.
Applied Cognitive Psychology, v37 n1 p26-41 Jan-Feb 2023
Interviewees sometimes deliberately omit reporting some information. Such omission lies differ from other lies because all the information interviewees present may be entirely truthful. Truth tellers and lie tellers carried out a mission. Truth tellers reported the entire mission truthfully. Lie tellers were also entirely truthful but left out one element of the mission. In truth tellers' statements, only the parts that lie tellers were also asked to recall were analysed. Interviews were carried out via the Cognitive Credibility Assessment, Reality Interview, or standard interview protocol. Dependent variables were the details, complications and verifiable sources interviewees reported. A questionnaire measured three deception strategies: 'Tell it all', 'keep it simple' or 'paying attention to demeanour'. Lie tellers reported fewer details, complications and verifiable sources than truth tellers and reporting these variables was negatively correlated with the 'keep it simple' and 'demeanour' strategies. The type of interview protocol did not affect the results.
Descriptors: Interviews, Deception, Ethics, Disclosure, Comparative Analysis, Recall (Psychology), Credibility, Correlation, Evaluation Methods
Wiley. Available from: John Wiley & Sons, Inc. 111 River Street, Hoboken, NJ 07030. Tel: 800-835-6770; e-mail: cs-journals@wiley.com; Web site: https://www-wiley-com.bibliotheek.ehb.be/en-us
Publication Type: Journal Articles; Reports - Research
Education Level: N/A
Audience: N/A
Language: English
Sponsor: N/A
Authoring Institution: N/A
Grant or Contract Numbers: N/A
Author Affiliations: N/A