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Yamaguchi, Motonori; Proctor, Robert W. – Psychological Review, 2012
The present study proposes and examines the multidimensional vector (MDV) model framework as a modeling schema for choice response times. MDV extends the Thurstonian model, as well as signal detection theory, to classification tasks by taking into account the influence of response properties on stimulus discrimination. It is capable of accounting…
Descriptors: Educational Technology, Mathematical Models, Scaling, Experiments
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Whitely, Susan E. – Applied Psychological Measurement, 1979
A model which gives maximum likelihood estimates of measurement error within the context of a simplex model for practice effects is presented. The appropriateness of the model is tested for five traits, and error estimates are compared to the classical formula estimates. (Author/JKS)
Descriptors: Error of Measurement, Error Patterns, Higher Education, Mathematical Models
Levine, Michael V.; Drasgow, Fritz – 1980
Appropriateness measurement is a general approach to the problem caused by multiple choice tests failing to measure accurately the ability of atypical examinees. The conceptual framework of appropriateness measurement is presented, and several statistical indices of the appropriateness of a multiple choice test for an examinee are noted. A series…
Descriptors: Aptitude Tests, Cheating, Error of Measurement, Error Patterns
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Lord, Frederic M. – Journal of Educational Measurement, 1986
Advantages and disadvantages of joint maximum likelihood, marginal maximum likelihood, and Bayesian methods of parameter estimation in item response theory are discussed and compared. (Author)
Descriptors: Bayesian Statistics, Error Patterns, Estimation (Mathematics), Higher Education
Greeno, James G.; And Others – 1985
Research was conducted investigating properties of skill in learning, in the domain of elementary algebra. Thinking-aloud protocols indicate that early knowledge of the subjects studied was fragmentary, rather than involving systematically flawed procedures. Computational models, developed to simulate observed errors, focused on the role of…
Descriptors: Algebra, Cognitive Processes, Elementary Secondary Education, Error Patterns
Advanced Technology, Inc., Reston, VA. – 1984
The development of the error prone model (EPM) for the 1984-1985 student financial aid validation criteria for Pell Grant recipient selection is discussed, based on a comparison of the 1983-1984 EPM criteria and a newly estimated EPM. Procedures/assumptions on which the new EPM was based include: a sample of 1982-1983 Pell Grant recipients…
Descriptors: Comparative Analysis, Dependents, Error Patterns, Evaluation Criteria
Advanced Technology, Inc., Reston, VA. – 1982
The development of a number of error-prone models to select Pell Grant recipients for validation is discussed. The 1983-1984 Pell Grant validation strategy consists of a two-stage approach: selection using Pre-Established Criteria (PEC) followed by selection using Error Prone Modeling (EPM). The database used for model development consists of a…
Descriptors: Comparative Analysis, Cost Effectiveness, Dependents, Error Patterns