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McKinley, Robert L.; Reckase, Mark D. – 1983
Real test data of unknown structure were analyzed using both a unidimensional and a multidimensional latent trait model in an attempt to determine the underlying components of the test. The models used were the three-parameter logistic model and a multidimensional extension of the two-parameter logistic model. The basic design for the analysis of…
Descriptors: Data Analysis, Difficulty Level, Goodness of Fit, Higher Education
Peer reviewedFerrando, Pere J. – Multivariate Behavioral Research, 1996
The usefulness of the confirmatory factor analysis model of D. Sorbom (1974) to estimate invariant difficulty and discrimination item parameters on a personality scale was supported in a study using responses of 834 undergraduates to the Social Worry Scale of the Anxious Thoughts Inventory (A. Wells, 1994). (SLD)
Descriptors: Anxiety, Difficulty Level, Estimation (Mathematics), Higher Education
Peer reviewedAlbers, Wim; And Others – Psychometrika, 1989
A model is presented for the growth of knowledge reflected by 24 progress tests completed by approximately 600 students at the University of Limburg (Netherlands) Medical School. Based on the Rasch model, this model treats both the person's ability and the difficulty of the question as random variables. (SLD)
Descriptors: Ability, Academic Achievement, Difficulty Level, Equations (Mathematics)
Beller, Michal – 1992
It has previously been shown by M. Beller (1990) that an additive tree (Addtree, a hierarchical tree representation of similarity data developed by S. Sattath and A. Tversky in 1977), may be useful for representing the structure between tests and items through the similarity among them as measured by their intercorrelations. In this study, the…
Descriptors: College Entrance Examinations, Decision Making, Difficulty Level, Equations (Mathematics)
Douglass, James B. – 1980
The three-, two- and one-parameter (Rasch) logistic item characteristic curve models are compared for use in a large multi-section college course. Only the three-parameter model produced clearly unacceptable parameter estimates for 100 item tests with examinee samples ranging from 594 to 1082. The Rasch and two-parameter models were compared for…
Descriptors: Academic Ability, Achievement Tests, Course Content, Difficulty Level
Reckase, Mark D. – 1985
Multidimensional item difficulty (MID) is proposed as a means of describing test items which measure more than one ability. With mathematical story problems, for instance, both mathematical and verbal skills are required to obtain a correct answer. The proposed measure of MID is based upon three general assumptions: (1) the probability of…
Descriptors: Ability Identification, College Entrance Examinations, College Mathematics, Difficulty Level
Douglass, James B. – 1981
Relationships between item bias, item difficulty invariance, Rasch tests of item fit, and item position in a speeded 72-item Michigan State University Vocabulary Placement Test were investigated using 143 black males, 289 black females, 2,953 white males and 3,271 white females. Measures of item bias and item difficulty invariance were determined…
Descriptors: Black Students, Computer Programs, Correlation, Difficulty Level
Bernknopf, Stan; And Others – 1979
The effectiveness of a model for determining a minimal cut-off score for criterion-referenced tests was examined. The model, based upon techniques presented originally by Nedelsky and by Angoff, was first used in conjunction with a multiple choice test developed for use in certifying school counselors in Georgia. A "knowledge estimation panel" was…
Descriptors: Counselor Certification, Court Litigation, Criterion Referenced Tests, Cutting Scores
Kingston, Neal M. – 1985
Birnbaum's three-parameter logistic item response model was used to study guessing behavior of low ability examinees on the Graduate Record Examinations (GRE) General Test, Verbal Measure. GRE scoring procedures had recently changed, from a scoring formula which corrected for guessing, to number-right scoring. The three-parameter theory was used…
Descriptors: Academic Aptitude, Analysis of Variance, College Entrance Examinations, Difficulty Level
Smith, Richard M.; Mitchell, Virginia P. – 1979
To improve the accuracy of college placement, Rasch scoring and person-fit statistics on the Comparative Guidance and Placement test (CGP) was compared to the traditional right-only scoring. Correlations were calculated between English and mathematics course grades and scores of 1,448 entering freshmen on the reading, writing, and mathematics…
Descriptors: Academic Ability, Computer Programs, Difficulty Level, Goodness of Fit
Nassif, Paula M.; And Others – 1979
A procedure which employs a method of item substitution based on item difficulty is recommended for developing parallel criterion referenced test forms. This procedure is currently being used in the Florida functional literacy testing program and the Georgia teacher certification testing program. Reasons for developing parallel test forms involve…
Descriptors: Criterion Referenced Tests, Difficulty Level, Equated Scores, Functional Literacy
Hambleton, Ronald K.; Rogers, H. Jane – 1986
This report was designed to respond to two major methodological shortcomings in the item bias literature: (1) misfitting test models; and (2) the use of significance tests. Specifically, the goals of the research were to describe a newly developed method known as the "plot method" for identifying potentially biased test items and to…
Descriptors: Criterion Referenced Tests, Culture Fair Tests, Difficulty Level, Estimation (Mathematics)
International Association for Development of the Information Society, 2012
The IADIS CELDA 2012 Conference intention was to address the main issues concerned with evolving learning processes and supporting pedagogies and applications in the digital age. There had been advances in both cognitive psychology and computing that have affected the educational arena. The convergence of these two disciplines is increasing at a…
Descriptors: Academic Achievement, Academic Persistence, Academic Support Services, Access to Computers


