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| Psychometrika | 1 |
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| Reports - Research | 3 |
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Tatsuoka, Kikumi K.; Tatsuoka, Maurice M. – 1980
An index measuring the degree to which a binary response pattern conforms to some baseline pattern was defined and named the Pattern Conformity Index (PCI). One way of conceptualizing what the PCI measures is the extent to which each individual's particular response pattern contributes to, or detracts from, the overall consistency found in the…
Descriptors: Error Patterns, Goodness of Fit, Item Analysis, Mathematical Models
Peer reviewedIsaac, Paul D.; Poor, David D. S. – Psychometrika, 1974
Descriptors: Error Patterns, Factor Analysis, Goodness of Fit, Mathematical Models
Jones, Douglas H. – 1985
The progress of modern mental test theory depends very much on the techniques of maximum likelihood estimation, and many popular applications make use of likelihoods induced by logistic item response models. While, in reality, item responses are nonreplicate within a single examinee and the logistic models are only ideal, practitioners make…
Descriptors: Error Patterns, Functions (Mathematics), Goodness of Fit, Item Analysis
Tatsuoka, Kikumi K.; Tatsuoka, Maurice M. – 1985
The study examines the rule space model, a probabilistic model capable of measuring cognitive skill acquisition and of diagnosing erroneous rules of operation in a procedural domain. The model involves two important components: (1) determination of a set of bug distributions (bug density functions representing clusters around the rules); and (2)…
Descriptors: Artificial Intelligence, Cognitive Processes, Computer Assisted Testing, Computer Software


