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Wu, Huey-Min; Kuo, Bor-Chen; Yang, Jinn-Min – Educational Technology & Society, 2012
In recent years, many computerized test systems have been developed for diagnosing students' learning profiles. Nevertheless, it remains a challenging issue to find an adaptive testing algorithm to both shorten testing time and precisely diagnose the knowledge status of students. In order to find a suitable algorithm, four adaptive testing…
Descriptors: Adaptive Testing, Test Items, Computer Assisted Testing, Mathematics
Braeken, Johan; Blömeke, Sigrid – Assessment & Evaluation in Higher Education, 2016
Using data from the international Teacher Education and Development Study: Learning to Teach Mathematics (TEDS-M), the measurement equivalence of teachers' beliefs across countries is investigated for the case of "mathematics-as-a fixed-ability". Measurement equivalence is a crucial topic in all international large-scale assessments and…
Descriptors: Comparative Analysis, Bayesian Statistics, Test Bias, Teacher Education
Hu, Xiangen, Ed.; Barnes, Tiffany, Ed.; Hershkovitz, Arnon, Ed.; Paquette, Luc, Ed. – International Educational Data Mining Society, 2017
The 10th International Conference on Educational Data Mining (EDM 2017) is held under the auspices of the International Educational Data Mining Society at the Optics Velley Kingdom Plaza Hotel, Wuhan, Hubei Province, in China. This years conference features two invited talks by: Dr. Jie Tang, Associate Professor with the Department of Computer…
Descriptors: Data Analysis, Data Collection, Graphs, Data Use
Barnes, Tiffany, Ed.; Desmarais, Michel, Ed.; Romero, Cristobal, Ed.; Ventura, Sebastian, Ed. – International Working Group on Educational Data Mining, 2009
The Second International Conference on Educational Data Mining (EDM2009) was held at the University of Cordoba, Spain, on July 1-3, 2009. EDM brings together researchers from computer science, education, psychology, psychometrics, and statistics to analyze large data sets to answer educational research questions. The increase in instrumented…
Descriptors: Data Analysis, Educational Research, Conferences (Gatherings), Foreign Countries

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