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Holland, Paul W.; Thayer, Dorothy T. – 1985
An alternative definition has been developed of the delta scale of item difficulty used at Educational Testing Service. The traditional delta scale uses an inverse normal transformation based on normal ogive models developed years ago. However, no use is made of this fact in typical uses of item deltas. It is simply one way to make the probability…
Descriptors: Difficulty Level, Error Patterns, Estimation (Mathematics), Item Analysis
Peer reviewed Peer reviewed
Fava, Joseph L.; Velicer, Wayne F. – Multivariate Behavioral Research, 1992
Principal component, image component, three types of factor score estimates, and one scale score method were compared over different levels of variables, saturations, sample sizes, variable to component ratios, and pattern rotations. There were virtually no overall differences among methods, with the average correlation between matched scores…
Descriptors: Comparative Analysis, Correlation, Equations (Mathematics), Estimation (Mathematics)
Marco, Gary L. – 1984
Using raw-to-scaled-score conversions derived from test-score equating to link item-parameter estimates from the one-parameter (Rasch) and three-parameter logistic models, this study evaluated an indirect method for converting item response theory estimates to a common scale. Data were taken from Petersen's Scholastic Aptitude Test (SAT) scale…
Descriptors: College Entrance Examinations, Equated Scores, Estimation (Mathematics), Latent Trait Theory
de Leeuw, Jan; Kreft, Ita – Journal of Education Statistics, 1986
A statistical model is proposed for both contextual analysis and slopes as outcomes analysis. A random coefficient model is investigated in detail. Various estimation models are reviewed and applied to a Dutch school-career example. (Author/LMO)
Descriptors: Elementary Education, Estimation (Mathematics), Least Squares Statistics, Mathematical Models
Willett, John B.; Singer, Judith D. – 1987
In research, data sets often occur in which the variance of the distribution of the dependent variable at given levels of the predictors is a function of the values of the predictors. In this situation, the use of weighted least-squares (WLS) or techniques is required. Weights suitable for use in a WLS regression analysis must be estimated. A…
Descriptors: Error of Measurement, Estimation (Mathematics), Goodness of Fit, Least Squares Statistics
Peer reviewed Peer reviewed
Kolen, Michael J.; And Others – Journal of Educational Measurement, 1992
A procedure is described for estimating the reliability and conditional standard errors of measurement of scale scores incorporating the discrete transformation of raw scores to scale scores. The method is illustrated using a strong true score model, and practical applications are described. (SLD)
Descriptors: College Entrance Examinations, Equations (Mathematics), Error of Measurement, Estimation (Mathematics)
Paulson, James A. – 1985
This paper discusses the use of latent class structure as a modelling framework for tests in which much of the data conforms to a relatively small number of systematic patterns. Application of this framework to the analysis of tests has been limited because available parameter estimation algorithms can only handle a relatively small number of…
Descriptors: Algorithms, Correlation, Estimation (Mathematics), Factor Analysis
Marco, Gary L.; And Others – 1985
Three item response models were evaluated for estimating item parameters and equating test scores. The models, which approximated the traditional three-parameter model, included: (1) the Rasch one-parameter model, operationalized in the BICAL computer program; (2) an approximate three-parameter logistic model based on coarse group data divided…
Descriptors: College Entrance Examinations, Comparative Analysis, Computer Software, Equated Scores
Johnson, Eugene – 1989
The 1990 National Assessment of Educational Progress (NAEP) will mark the first time that state-level comparisons will be possible with NAEP data. The 1990 data will contain, as a trial component, state-level assessments of eighth graders in mathematics. Mathematics and reading comparisons for fourth graders will be added in 1992. Statistical…
Descriptors: Achievement Tests, Demography, Elementary Education, Elementary School Students
Samejima, Fumiko – 1984
The use of a three-parameter logistic model for applying latent trait theory has become more popular because of the availability of computer programs. The program Logist 5 can be used not only for the item parameter estimation in the three-parameter logistic model, but also in the two parameter logistic model by setting the third parameter equal…
Descriptors: Correlation, Elementary Secondary Education, Equated Scores, Estimation (Mathematics)
Peer reviewed Peer reviewed
Yamamoto, Kentaro; Mazzeo, John – Journal of Educational Statistics, 1992
The need for scale linking in the National Assessment of Educational Progress (NAEP) is discussed, and the specific procedures used to carry out the linking in the context of the major analyses of the 1990 NAEP mathematics assessment are described. Issues remaining to be addressed are outlined. (SLD)
Descriptors: Comparative Testing, Educational Assessment, Elementary Secondary Education, Equated Scores
Legg, Sue M.; Algina, James – 1986
This paper focuses on the questions which arise as test practitioners monitor score scales derived from latent trait theory. Large scale assessment programs are dynamic and constantly challenge the assumptions and limits of latent trait models. Even though testing programs evolve, test scores must remain reliable indicators of progress.…
Descriptors: Difficulty Level, Educational Assessment, Elementary Secondary Education, Equated Scores
Hambleton, Ronald K.; Rogers, H. Jane – 1986
This report was designed to respond to two major methodological shortcomings in the item bias literature: (1) misfitting test models; and (2) the use of significance tests. Specifically, the goals of the research were to describe a newly developed method known as the "plot method" for identifying potentially biased test items and to…
Descriptors: Criterion Referenced Tests, Culture Fair Tests, Difficulty Level, Estimation (Mathematics)