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Kim, Seock-Ho – 1997
Hierarchical Bayes procedures for the two-parameter logistic item response model were compared for estimating item parameters. Simulated data sets were analyzed using two different Bayes estimation procedures, the two-stage hierarchical Bayes estimation (HB2) and the marginal Bayesian with known hyperparameters (MB), and marginal maximum…
Descriptors: Bayesian Statistics, Difficulty Level, Estimation (Mathematics), Item Bias
Seong, Tae-Je; And Others – 1997
This study was designed to compare the accuracy of three commonly used ability estimation procedures under the graded response model. The three methods, maximum likelihood (ML), expected a posteriori (EAP), and maximum a posteriori (MAP), were compared using a recovery study design for two sample sizes, two underlying ability distributions, and…
Descriptors: Ability, Comparative Analysis, Difficulty Level, Estimation (Mathematics)
De Ayala, R. J. – 1993
Previous work on the effects of dimensionality on parameter estimation was extended from dichotomous models to the polytomous graded response (GR) model. A multidimensional GR model was developed to generate data in one-, two-, and three-dimensions, with two- and three-dimensional conditions varying in their interdimensional associations. Test…
Descriptors: Computer Simulation, Correlation, Difficulty Level, Estimation (Mathematics)
Sykes, Robert C.; Ito, Kyoko – 1995
Whether the presence of bidimensionality has any effect on the adaptive recalibration of test items was studied through live-data simulation of computer adaptive testing (CAT) forms. The source data were examinee responses to the 298 scored multiple choice items of a licensure examination in a health care profession. Three 75-item part-forms,…
Descriptors: Adaptive Testing, Computer Assisted Testing, Difficulty Level, Estimation (Mathematics)
Kromrey, Jeffrey D.; Bacon, Tina P. – 1992
A Monte Carlo study was conducted to estimate the small sample standard errors and statistical bias of psychometric statistics commonly used in the analysis of achievement tests. The statistics examined in this research were: (1) the index of item difficulty; (2) the index of item discrimination; (3) the corrected item-total point-biserial…
Descriptors: Achievement Tests, Comparative Analysis, Difficulty Level, Estimation (Mathematics)
Smith, Robert L.; Carlson, Alfred B. – 1995
The feasibility of constructing test forms with practically equivalent cut scores using judges' estimates of item difficulty as target "statistical" specifications was investigated. Test forms with equivalent judgmental cut scores (based on judgments of item difficulty) were assembled using items from six operational forms of the…
Descriptors: Cutting Scores, Decision Making, Difficulty Level, Equated Scores
Ito, Kyoko; Sykes, Robert C. – 1994
Responses to previously calibrated items administered in a computerized adaptive testing (CAT) mode may be used to recalibrate the items. This live-data simulation study investigated the possibility, and limitations, of on-line adaptive recalibration of precalibrated items. Responses to items of a Rasch-based paper-and-pencil licensure examination…
Descriptors: Ability, Adaptive Testing, Computer Assisted Testing, Difficulty Level
Farish, Stephen J. – 1984
The stability of Rasch test item difficulty parameters was investigated under varying conditions. Data were taken from a mathematics achievement test administered to over 2,000 Australian students. The experiments included: (1) relative stability of the Rasch, traditional, and z-item difficulty parameters using different sample sizes and designs;…
Descriptors: Achievement Tests, Difficulty Level, Estimation (Mathematics), Foreign Countries
Hambleton, Ronald K.; Rogers, H. Jane – 1986
This report was designed to respond to two major methodological shortcomings in the item bias literature: (1) misfitting test models; and (2) the use of significance tests. Specifically, the goals of the research were to describe a newly developed method known as the "plot method" for identifying potentially biased test items and to…
Descriptors: Criterion Referenced Tests, Culture Fair Tests, Difficulty Level, Estimation (Mathematics)


