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Lu, Ru; Guo, Hongwen; Dorans, Neil J. – ETS Research Report Series, 2021
Two families of analysis methods can be used for differential item functioning (DIF) analysis. One family is DIF analysis based on observed scores, such as the Mantel-Haenszel (MH) and the standardized proportion-correct metric for DIF procedures; the other is analysis based on latent ability, in which the statistic is a measure of departure from…
Descriptors: Robustness (Statistics), Weighted Scores, Test Items, Item Analysis
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Patton, Jeffrey M.; Cheng, Ying; Hong, Maxwell; Diao, Qi – Journal of Educational and Behavioral Statistics, 2019
In psychological and survey research, the prevalence and serious consequences of careless responses from unmotivated participants are well known. In this study, we propose to iteratively detect careless responders and cleanse the data by removing their responses. The careless responders are detected using person-fit statistics. In two simulation…
Descriptors: Test Items, Response Style (Tests), Identification, Computation
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Kannan, Priya; Sgammato, Adrienne; Tannenbaum, Richard J.; Katz, Irvin R. – Applied Measurement in Education, 2015
The Angoff method requires experts to view every item on the test and make a probability judgment. This can be time consuming when there are large numbers of items on the test. In this study, a G-theory framework was used to determine if a subset of items can be used to make generalizable cut-score recommendations. Angoff ratings (i.e.,…
Descriptors: Reliability, Standard Setting (Scoring), Cutting Scores, Test Items
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Sueiro, Manuel J.; Abad, Francisco J. – Educational and Psychological Measurement, 2011
The distance between nonparametric and parametric item characteristic curves has been proposed as an index of goodness of fit in item response theory in the form of a root integrated squared error index. This article proposes to use the posterior distribution of the latent trait as the nonparametric model and compares the performance of an index…
Descriptors: Goodness of Fit, Item Response Theory, Nonparametric Statistics, Probability
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Oranje, Andreas; Li, Deping; Kandathil, Mathew – ETS Research Report Series, 2009
Several complex sample standard error estimators based on linearization and resampling for the latent regression model of the National Assessment of Educational Progress (NAEP) are studied with respect to design choices such as number of items, number of regressors, and the efficiency of the sample. This paper provides an evaluation of the extent…
Descriptors: Error of Measurement, Computation, Regression (Statistics), National Competency Tests
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Kristof, Walter – Psychometrika, 1971
Descriptors: Cognitive Measurement, Error of Measurement, Mathematical Models, Psychological Testing
Wingersky, Marilyn S.; Lord, Frederic M. – 1983
The sampling errors of maximum likelihood estimates of item-response theory parameters are studied in the case where both people and item parameters are estimated simultaneously. A check on the validity of the standard error formulas is carried out. The effect of varying sample size, test length, and the shape of the ability distribution is…
Descriptors: Error of Measurement, Estimation (Mathematics), Item Banks, Latent Trait Theory